INVITED TALK

H. Iwai¹, K. Kakushima¹, T. Hoshii¹, K. Tsutsui¹, A. Nakajima², S. Nishizawa³, H. Wakabayashi¹, I. Muneta¹, K. Sato⁴, T. Matsudai⁵, W. Saito⁵, T. Saraya⁶, K. Itou⁵, M. Fukui⁶, S. Suzuki⁶, M. Kobayashi⁶, T. Takakura⁶, T. Hiramoto⁶, A. Ogura⁷, Y. Numasawa⁷, I. Omura⁸, and H. Ohashi¹

¹Tokyo Institute of Technology, Yokohama, Japan
²Nat. Inst. Advanced Industrial Science and Technology, Tsukuba, Japan
³Kyushu University, Fukuoka, Japan
⁴Mitsubishi Electric Corp., Fukuoka, Japan
⁵Toshiba Electronic Devices & Storage Corp.,Tokyo, Japan
⁶The University of Tokyo, Tokyo, Japan
⁷Meiji University, Kawasaki, Japan
⁸Kyushu Inst. of Technology,Kitakyushu, Japan