SESSION 3

Simulation

Monday 19

14:30 – 14:50 Study of the 1D Scattering Mechanisms’ Impact on the Mobility in Si Nanowire Transistors

 C. Medina-Bailón1, T. Sadi2, M. Nedjalkov3, J. Lee1, S. Berrada1, H. Carrillo-Nunez1, V. Georgiev1, S. Selberherr3, and A. Asenov1

1School of Engineering, University of Glasgow, Glasgow G12 8LT, Scotland, UK

2Department of Neuroscience and Biomedical Engineering, Aalto University, P.O. Box 12200, FI-00076 Aalto, Finland

3Institute for Microlectronics, TU-Vienna, Guẞhausstraẞe 27-29, E360 A-1040, Vienna, Austria

14:50 – 15:10 3D Multi-Subband Ensemble Monte Carlo simulation of ‹100› and ‹110› Si nanowire FETs

L. Donetti, C. Sampedro, F.G. Ruiz, A. Godoy, F. Gamiz

Departamento de Electrónica and CITIC, Universidad de Granada, Spain

15:10 – 15:30 Innovative Tunnel FETs architectures

C. Diaz Llorente1, S. Martinie1, S. Cristoloveanu2, J.P. Colinge1, C. Le Royer1, G. Ghibaudo2, J. Wan3, and M. Vinet1

1CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France

2IMEP-LAHC, INP-Grenoble, MINATEC campus, 38016 Grenoble, France

3Fudan University, Shanghai, China

15:30 – 15:50 TFET-based Inverter Performance in the Presence of Traps and Localized Strain

M. Visciarelli1, E. Gnani2, A. Gnudi2, S. Reggiani2, G. Baccarani2

1Dep. of Appl. Phys., School of Engineering Sciences, KTH Royal Institute of Technology, SE-16440 Kista, Sweden

2ARCES and DEI – University of Bologna, 40136 Bologna, Italy