Noise Characterization

Wednesday 21

10:00 – 10:20 Low-Frequency Noise in Surface-treated AlGaN/GaN HFETs

Ki-Sik Im1, Jun-Hyeok Lee2, Christoforos G. Theodorou3, Gérard Ghibaudo3, Sorin Cristoloveanu3, and Jung-Hee Lee2

1Institute of Semiconductor Fusion Technology and

2School of Electronics Engineering, Kyungpook National University, Daegu 702-701, Korea

3Institute of Microelectronics, Electromagnetism and Photonics, Grenoble Institute of Technology, Grenoble 38016, France

10:20 – 10:40 Discussion on the 1/f noise behavior in Si gate-all-around nanowire MOSFETs at liquid helium temperatures

 D. Boudier1, B. Cretu1, E. Simoen2, A. Veloso2 and N. Collaert2

1Normandie Univ, UNICAEN, ENSICAEN, CNRS, GREYC, 14000 Caen, France

2Imec, Kapeldreef 75, B-3001 Leuven, Belgium

10:40 – 11:00 A Noise and RTN-Removal Smart Method for the Parameter Extraction of CMOS Aging Compact Models

Javier Diaz-Fortuny1, Javier Martin-Martinez1, Rosana Rodriguez1, Rafael Castro-Lopez2, Elisenda Roca2, Francisco F. Fernandez2 and Montserrat Nafria1

1Universitat Autònoma de Barcelona (UAB), Electronic Engineering Department, REDEC group, Barcelona, Spain

2Instituto de Microelectrónica de Sevilla, IMSE-CNM, CSIC and Universidad de Sevilla, Spain